Semiconductor structure and manufacturing method thereof

ABSTRACT

A method of manufacturing a semiconductor structure includes forming a redistribution layer (RDL); forming a conductive member over the RDL; performing a first electrical test through the conductive member; disposing a first die over the RDL; performing a second electrical test through the conductive member; and disposing a second die over the first die and the conductive member.

PRIORITY CLAIM AND CROSS-REFERENCE

This application claims priority to U.S. Provisional Application No.62/447,633 filed on Jan. 18, 2017, entitled “A Semiconductor Structureand A Manufacturing Method Thereof,” which application is herebyincorporated herein by reference.

BACKGROUND

Electronic equipments using semiconductor devices are essential for manymodern applications. With the advancement of electronic technology, thesemiconductor devices are becoming increasingly smaller in size whilehaving greater functionality and greater amounts of integratedcircuitry. Due to the miniaturized scale of the semiconductor device, awafer level packaging (WLP) is widely used for its low cost andrelatively simple manufacturing operations. During the WLP operation, anumber of semiconductor components are assembled on the semiconductordevice. Furthermore, numerous manufacturing operations are implementedwithin such a small semiconductor device.

However, the manufacturing operations of the semiconductor deviceinvolve many steps and operations on such a small and thin semiconductordevice. The manufacturing of the semiconductor device in a miniaturizedscale becomes more complicated. An increase in a complexity ofmanufacturing the semiconductor device may cause deficiencies such aspoor electrical interconnection, delamination of components, or otherissues, resulting in a high yield loss of the semiconductor device. Assuch, there are many challenges for modifying a structure of thesemiconductor devices and improving the manufacturing operations.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isemphasized that, in accordance with the standard practice in theindustry, various features are not drawn to scale. In fact, thedimensions of the various features may be arbitrarily increased orreduced for clarity of discussion.

FIG. 1 is a schematic cross sectional view of a semiconductor structurein accordance with some embodiments of the present disclosure.

FIG. 2 is a schematic cross sectional view of a semiconductor structurein accordance with some embodiments of the present disclosure.

FIG. 3 is a schematic cross sectional view of a semiconductor structurein accordance with some embodiments of the present disclosure.

FIG. 4 is a schematic cross sectional view of a semiconductor structurein accordance with some embodiments of the present disclosure.

FIGS. 5-8 are schematic cross sectional views of conductive members invarious arrangements.

FIG. 9 is a flow diagram of a method of manufacturing a semiconductorstructure in accordance with some embodiments of the present disclosure.

FIGS. 9A-9J are schematic views of manufacturing a semiconductorstructure by a method of FIG. 9 in accordance with some embodiments ofthe present disclosure.

FIG. 10 is a flow diagram of a method of manufacturing a semiconductorstructure in accordance with some embodiments of the present disclosure.

FIGS. 10A-10H are schematic views of manufacturing a semiconductorstructure by a method of FIG. 10 in accordance with some embodiments ofthe present disclosure.

DETAILED DESCRIPTION OF THE DISCLOSURE

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

Other features and processes may also be included. For example, testingstructures may be included to aid in the verification testing of the 3Dpackaging or 3DIC devices. The testing structures may include, forexample, test pads formed in a redistribution layer or on a substratethat allows the testing of the 3D packaging or 3DIC, the use of probesand/or probe cards, and the like. The verification testing may beperformed on intermediate structures as well as the final structure.Additionally, the structures and methods disclosed herein may be used inconjunction with testing methodologies that incorporate intermediateverification of known good dies to increase the yield and decreasecosts.

A die is fabricated and singulated from a semiconductive wafer. Aftersingulation, the die is packaged to become a semiconductor package andintegrated with another die or package. The die is encapsulated by amolding, and I/O terminals of the die are routed out through conductivelines disposed within a dielectric layer, and the die is electricallyconnected to another dies or packages by a via extending through themolding or a connector between the dies or packages. However, suchconfiguration may not be feasible for identifying failure of dies orelectrical interconnections at an earlier manufacturing stage or beforecompletion of the manufacturing. For example, an electrical testing canonly be performed when the package is completed.

In the present disclosure, a semiconductor structure is disclosed. Thesemiconductor structure includes a dummy conductive member forelectrical testing during the manufacturing of the semiconductorstructure. The dummy conductive member is formed during themanufacturing, and a die or an electrical interconnection in thesemiconductor structure can be tested through the dummy conductivemember during the manufacturing or before the completion of thesemiconductor structure. As such, failure of die or electricalinterconnection can be identified at an earlier manufacturing stage.Therefore, wastage of material can be minimized and a yield of thesemiconductor structure can be increased or improved.

FIG. 1 is a schematic cross sectional view of a semiconductor structure100 in accordance with various embodiments of the present disclosure. Insome embodiments, the semiconductor structure 100 includes aredistribution layer (RDL) 101, a molding 102, conductive members 103, afirst die 104, a second die 105, an second underfill material 106 and aconductive bump 107.

In some embodiments, the semiconductor structure 100 is a semiconductorpackage. In some embodiments, the semiconductor structure 100 is anintegrated fan out (InFO) package, where I/O terminals of the first die104 or the second die 105 are fanned out and redistributed over asurface of the first die 104 or the second die 105 in a greater area. Insome embodiments, the semiconductor structure 100 is a package onpackage (PoP), that dies or packages are stacked over each other.

In some embodiments, the RDL 101 re-routes a path from the first die 104or the second die 105 so as to redistribute I/O terminals of the firstdie 104 or the second die 105 over the molding 102. In some embodiments,the RDL 101 is a post passivation interconnection (PPI). In someembodiments, the RDL 101 includes a first side 101 b and a second side101 c opposite to the first side 101 b. In some embodiments, the RDL 101includes one or more dielectric layers 101 a and one or more conductivetraces (101 d and 101 e) disposed within and surrounded by thedielectric layer(s) 101 a.

In some embodiments, the dielectric layer 101 a includes dielectricmaterial such as silicon oxide, silicon nitride, silicon carbide,silicon oxynitride, polymer, polybenzoxazole (PBO), polyimide,benzocyclobutene (BCB), or the like. In some embodiments, the conductivetraces (101 d and 101 e) includes conductive material such as gold,silver, copper, nickel, tungsten, aluminum, palladium and/or alloysthereof.

In some embodiments, the conductive trace includes a land portion 101 dand a via portion 101 e disposed within the dielectric layer 101 a. Insome embodiments, the land portion 101 d is laterally extended in thedielectric layer 101 a. In some embodiments, the land portion 101 d iselectrically coupled with the via portion 101 e. In some embodiments,the land portion 101 d is disposed over the second side 101 c of thedielectric layer 101. In some embodiments, the land portion 101 d isconfigured to receive or couple with external conductive structure. Insome embodiments, the via portion 101 e is protruded from the landportion 101 d. In some embodiments, the via portion 101 e is verticallyextended between the first side 101 b and the second side 101 c of thedielectric layer 101 a. In some embodiments, the via portion 101 e isdisposed or extended between two of the land portions 101 d.

In some embodiments, the molding 102 is disposed over the RDL 101. Insome embodiments, the molding 102 is disposed over the dielectric layer101 a. In some embodiments, the molding 102 is disposed over the firstside 101 b of the dielectric layer 101 a. In some embodiments, themolding 102 is in contact with the dielectric layer 101 a. In someembodiments, the molding 102 can be a single layer film or a compositestack. In some embodiments, the molding 102 includes various materials,such as molding compound, molding underfill, epoxy, resin, or the like.In some embodiments, the molding 102 has a high thermal conductivity, alow moisture absorption rate and a high flexural strength.

In some embodiments, conductive members (103 a, 103 b or 103 c) aredisposed over or surrounded by the dielectric layer 101 a. In someembodiments, In some embodiments, the conductive members (103 a, 103 bor 103 c) includes conductive material such as gold, silver, copper,nickel, tungsten, aluminum, palladium and/or alloys thereof. In someembodiments, the conductive members (103 a, 103 b or 103 c) areelectrically connected to the conductive traces (101 d and 101 e). Insome embodiments, each of the conductive members (103 a, 103 b or 103 c)can be in different configurations or shapes such as a pillar, a post, abond pad, etc.

In some embodiments, the conductive members (103 a, 103 b or 103 c)includes a first conductive member 103 a, a second conductive member 103b and a third conductive member 103 c. In some embodiments, the firstconductive member 103 a is disposed over the RDL 101 and electricallyconnected to the conductive traces (101 d and 101 e). In someembodiments, the first conductive member 103 a is disposed within orsurrounded by the molding 102. In some embodiments, the first conductivemember 103 a is electrically coupled with the land portion 101 d. Insome embodiments, the first conductive member 103 a is directlycontacted with the land portion 101 d. In some embodiments, the firstconductive member 103 a is extended from the land portion 101 d. In someembodiments, the first conductive member 103 a is extended through themolding 102. In some embodiments, the first conductive member 103 a is adummy conductive member. In some embodiments, the first conductivemember 103 a is served as a testing terminal for testing the first die104 or an interconnection of the conductive trace (101 d, 101 e). Insome embodiments, the first conductive member 103 a is a via, a pillar,a post, a connector or the like. In some embodiments, the firstconductive member 103 a is a through integrated fan out via (TIV) orthrough molding via (TMV).

In some embodiments, the second conductive member 103 b is disposed overthe RDL 101 and electrically connected to the conductive traces (101 dand 101 e). In some embodiments, the second conductive member 103 b isdisposed within or surrounded by the molding 102. In some embodiments,the second conductive member 103 b is electrically coupled with the landportion 101 d. In some embodiments, the second conductive member 103 bis directly contacted with the land portion 101 d. In some embodiments,the second conductive member 103 b is extended from the land portion 101d. In some embodiments, the second conductive member 103 b is extendedthrough the molding 102. In some embodiments, the first conductivemember 103 a is disposed between the first die 104 and the secondconductive member 103 b. In some embodiments, the second conductivemember 103 b is a via, a pillar, a post, a connector or the like. Insome embodiments, the second conductive member 103 b is a throughintegrated fan out via (TIV) or through molding via (TMV). In someembodiments, the second conductive member 103 b has similarconfiguration as the first conductive member 103 a.

In some embodiments, the third conductive member 103 c is disposed overor partially surrounded by the dielectric layer 101 a. In someembodiments, the third conductive member 103 c is partially surroundedby the molding 102. In some embodiments, the third conductive member 103c is surrounded by the dielectric layer 101 a and the molding 102. Insome embodiments, the third conductive member 103 c is electricallyconnected to the conductive traces (101 d and 101 e). In someembodiments, the third conductive member 103 c is electrically coupledwith the land portion 101 d. In some embodiments, the third conductivemember 103 c is extended from the molding 102 to the dielectric layer101 a. In some embodiments, the third conductive member 103 c is a pad,a bond pad or the like.

In some embodiments, the third conductive member 103 c is extendedbetween the land portion 101 d and the first conductive member 103 a orthe second conductive member 103 b. In some embodiments, the thirdconductive member 103 c is disposed between the first conductive member103 a and the land portion 101 d. In some embodiments, the firstconductive member 103 a is electrically connected to the land portion101 d through the third conductive ember 103 c. In some embodiments, thefirst conductive member 103 a is bonded with the land portion 101 d bythe third conductive member 103 c. In some embodiments, the firstconductive member 103 c is extended from the third conductive member 103c.

In some embodiments, the first die 104 is disposed over the RDL 101. Insome embodiments, the first die 104 is surrounded by the molding 102. Insome embodiments, the first die 104 is fabricated with a predeterminedfunctional circuit within the first die 104. In some embodiments, thefirst die 104 is singulated from a semiconductive wafer by a mechanicalor laser blade. In some embodiments, the first die 104 comprises avariety of electrical circuits suitable for a particular application. Insome embodiments, the electrical circuits include various devices suchas transistors, capacitors, resistors, diodes and/or the like.

In some embodiments, the first die 104 comprises of any one of variousknown types of semiconductor devices such as memories (such as DRAM,SRAMS, flash memories, etc.), microprocessors, application-specificintegrated circuits (ASICs), or the like. In some embodiments, the firstdie 104 is a logic device die, central computing unit (CPU) die, or thelike. In some embodiments, the first die 104 is a system on chip (SOC)that integrates all electronic components into a single die. In someembodiments, the first die 104 is a die, a chip or a package. In someembodiments, the first die 104 has a top cross section (a cross sectionfrom the top view of the semiconductor structure 100 as shown in FIG. 1)in a quadrilateral, a rectangular or a square shape.

In some embodiments, the first die 104 includes a substrate whichcomprises semiconductive materials such as silicon. In some embodiments,the substrate of the first die 104 includes several circuitries andelectrical components disposed thereon. In some embodiments, thesubstrate of the first die 104 is a silicon substrate. In someembodiments, the first die 104 includes a first surface 104 a and asecond surface 104 b opposite to the first surface 104 a. In someembodiments, the first surface 104 a is a front side or active side ofthe first die 104. In some embodiments, the second surface 104 b is aback side or inactive side of the first die 104. In some embodiments,the second surface 104 b of the first die 104 is exposed from themolding 102. In some embodiments, the first die 104 includes a sidewall104 f disposed between the first surface 104 a and the second surface104 b. In some embodiments, the sidewall 104 f is vertically extendedbetween the first surface 104 a and the second surface 104 b. In someembodiments, the sidewall 104 f is processed by singulation, die sawing,laser cutting or similar operations. In some embodiments, the sidewall104 f has roughness caused by the singulation operations. In someembodiments, a roughness of the first surface 104 a or the secondsurface 104 b is substantially less than the roughness of the sidewall104 f. In some embodiments, the first surface 104 a and the sidewall 104f of the first die 104 are in contact with the molding 102.

In some embodiments, a first die pad 104 c is disposed over the firstdie 104. In some embodiments, the first die pad 104 c is disposed overor within the first surface 104 a of the first die 104. In someembodiments, the first die pad 104 c is electrically connected to acircuitry external to the first die 104, such that a circuitry of thefirst die 104 is electrically connected to the circuitry external to thefirst die 104 through the first die pad 104 c. In some embodiments, thefirst die pad 104 c is configured to electrically couple with aconductive structure. In some embodiments, the first die pad 104 cincludes gold, silver, copper, nickel, tungsten, aluminum, palladiumand/or alloys thereof.

In some embodiments, a first connector 104 d is disposed over andelectrically connected with the conductive trace (101 d, 101 e). In someembodiments, the first connector 104 d is disposed between the first die104 and the land portion 101 d. In some embodiments, the first connector104 d is disposed between the first die 104 and the third conductivemember 103 c. In some embodiments, the first connector 104 d isconfigured to electrically connect to a circuitry or a conductivestructure. In some embodiments, the first die 104 is electricallyconnected to the land portion 101 d through the first connector 104 d.In some embodiments, the first connector 104 d includes conductivematerial such as includes solder, copper, nickel, gold or etc. In someembodiments, the first connector 104 d is a conductive bump, a solderball, a ball grid array (BGA) ball, controlled collapse chip connection(C4) bump, microbump, a pillar, a post or the like. In some embodiments,the first connector 104 d is in a spherical, hemispherical orcylindrical shape.

In some embodiments, a first underfill material 104 e is disposed overthe RDL 101 to surround the first connector 104 d and partially surroundthe first die 104. In some embodiments, the first underfill material 104e is in contact with the second surface 104 b and the sidewall 104 f ofthe first die 104 and the first connector 104 d. In some embodiments,the first underfill material 104 e is an electrically insulated adhesivefor securing a bonding between the first die 104 and the thirdconductive member 103 c. In some embodiments, the first underfillmaterial 104 e includes epoxy resin, epoxy molding compounds or etc.

In some embodiments, the second die 105 is disposed over the first die104. In some embodiments, the second die 105 is disposed over the RDL101, the molding 102, the first conductive member 103 a or the secondconductive member 103 b. In some embodiments, a dimension of the seconddie 105 is substantially greater than a dimension of the first die 104.In some embodiments, a width of the second die 105 is substantiallygreater than a width of the first die 104.

In some embodiments, the second die 105 is fabricated with apredetermined functional circuit within the second die 105. In someembodiments, the second die 105 comprises a variety of electricalcircuits suitable for a particular application. In some embodiments, theelectrical circuits include various devices such as transistors,capacitors, resistors, diodes and/or the like. In some embodiments, thesecond die 105 comprises of any one of various known types ofsemiconductor devices such as memories (such as DRAM, SRAMS, flashmemories, etc.), microprocessors, application-specific integratedcircuits (ASICs), central computing unit (CPU) or the like. In someembodiments, the second die 105 is a die, a chip or a package. In someembodiments, the second die 105 has a top cross section (a cross sectionfrom the top view of the semiconductor structure 100 as shown in FIG. 1)in a quadrilateral, a rectangular or a square shape.

In some embodiments, the second die 105 includes a substrate whichcomprises semiconductive materials such as silicon. In some embodiments,the substrate of the second die 105 includes several circuitries andelectrical components disposed thereon. In some embodiments, thesubstrate of the second die 105 is a silicon substrate. In someembodiments, the second die 105 includes a third surface 105 a and afourth surface 105 b opposite to the third surface 105 a. In someembodiments, the third surface 105 a is a front side or active side ofthe second die 105. In some embodiments, the fourth surface 105 b is aback side or inactive side of the second die 105.

In some embodiments, a second connector 105 c is disposed over andelectrically connected to the second conductive member 103 b. In someembodiments, the second connector 105 c is disposed between the seconddie 105 and the second conductive member 103 b. In some embodiments, thesecond connector 105 c disposed over the first conductive member 103 ais absent. In some embodiments, the second connector 105 c is onlydisposed over the second conductive member 103 b. In some embodiments,the second connector 105 c is isolated from the first conductive member103 a. In some embodiments, the second die 105 is electrically connectedto the conductive trace (101 d, 101 e), the first die 104 or the secondconductive member 103 b through the second connector 105 c. In someembodiments, the first conductive member 103 a is electrically isolatedfrom the second die 105.

In some embodiments, the second connector 105 c includes conductivematerial such as includes solder, copper, nickel, gold or etc. In someembodiments, the second connector 105 c is a conductive bump, a solderball, a ball grid array (BGA) ball, controlled collapse chip connection(C4) bump, microbump, a pillar, a post or the like. In some embodiments,the second connector 105 c is in a spherical, hemispherical orcylindrical shape.

In some embodiments, an second underfill material 106 is disposedbetween the second die 105 and the molding 102. In some embodiments, thesecond underfill material 106 surrounds the second connector 105 c. Insome embodiments, the second underfill material 106 is in contact withan outer surface of the second connector 105 c. In some embodiments, thesecond underfill material 106 is disposed between the third surface 105a and the molding 102. In some embodiments, the second underfillmaterial 106 surrounds the third surface 105 a. In some embodiments, thesecond underfill material 106 is in contact with a sidewall of thesecond die 105. In some embodiments, the fourth surface 105 b of thesecond die 105 is exposed from the second underfill material 106. Insome embodiments, a portion of the second underfill material 106 isdisposed over or is in contact with the first conductive member 103 a.In some embodiments, the second underfill material 106 is anelectrically insulated adhesive for securing a bonding between thesecond die 105 and the second conductive member 103 b. In someembodiments, the second underfill material 106 includes epoxy resin,epoxy molding compounds or etc.

In some embodiments, the conductive bump 107 is disposed over the RDL101. In some embodiments, the conductive bump 107 is electricallyconnected to the conductive trace (101 d, 101 e), the first conductivemember 103 a, the second conductive member 103 b, the third conductivemember 103 c, the first die 104, the second connector 105 c or thesecond die 105. In some embodiments, the conductive bump 107 is bondedwith the land portion 101 d disposed over the second side 101 c of theRDL 101. In some embodiments, the conductive bump 107 is configured tobond with a conductive structure. In some embodiments, the conductivebump 107 is configured to electrically connect to a printed circuitboard (PCB). In some embodiments, the conductive bump 107 includesconductive material such as includes solder, copper, nickel, gold oretc. In some embodiments, the conductive bump 107 is a conductive bump,a solder ball, a ball grid array (BGA) ball, controlled collapse chipconnection (C4) bump, microbump, a pillar, a post or the like. In someembodiments, the conductive bump 107 is in a spherical, hemispherical orcylindrical shape.

FIG. 2 is a schematic cross sectional view of a semiconductor structure200 in accordance with various embodiments of the present disclosure. Insome embodiments, the semiconductor structure 200 includes a RDL 101, afirst die 104, a second die 105 and a conductive bump 107, which havesimilar configuration as those described above or illustrated in FIG. 1.

In some embodiments, the RDL 101 includes a dielectric layer 101 a, aland portion 101 d and a via portion 101 e, which have similarconfiguration as those described above or illustrated in FIG. 1. In someembodiments, the first die 104 is disposed over the RDL 101 andelectrically connected to the land portion 101 d, the via portion 101 eor the conductive bump 107 through a first connector 104 d. In someembodiments, the first connector 104 d has similar configuration as theone described above or illustrated in FIG. 1.

In some embodiments, a third conductive member (103 c-1, 103 c-2) isdisposed over or electrically coupled with the land portion 101 d of theRDL 101. In some embodiments, the third conductive member 103 c is apad, a bond pad or the like. In some embodiments, the third conductivemember 103 c is partially disposed over the dielectric layer 101 a andpartially surrounded by the dielectric layer 101 a. In some embodiments,In some embodiments, the third conductive member (103 c-1, 103 c-2)includes conductive material such as gold, silver, copper, nickel,tungsten, aluminum, palladium and/or alloys thereof.

In some embodiments, an second underfill material 106 is disposed overthe RDL 101. In some embodiments, the second underfill material 106 isdisposed over the dielectric layer 101 a. In some embodiments, thesecond underfill material 106 surrounds the first die 104. In someembodiments, the second underfill material 106 covers or surrounds thethird conductive member 103 c-1. In some embodiments, a top surface or aside surface of the third conductive member 103 c-1 is in contact withthe second underfill material 106. In some embodiments, the thirdconductive member 103 c-1 is a dummy pad. In some embodiments, the thirdconductive member 103 c-1 is served as a testing terminal for testingthe first die 104, the land portion 101 d or the via portion 101 e.

In some embodiments, the first connector 104 d is surrounded by thesecond underfill material 106. In some embodiments, the first surface104 a, the second surface 104 b and the sidewall 104 f of the first die104 are in contact with the second underfill material 106. In someembodiments, the first connector 104 d is in contact with the secondunderfill material 106. In some embodiments, the second underfillmaterial 106 includes epoxy resin, epoxy molding compounds or etc.

In some embodiments, the second die 105 is disposed over the RDL 101,the first die 104 and the second underfill material 106. In someembodiments, the second die 105 is electrically connected to the firstdie 104, the land portion 101 d, the via portion 101 e or the conductivebump 107 through a second connector 105 c. In some embodiments, thesecond die 105 has similar configuration as the one described above orillustrated in FIG. 1.

In some embodiments, the second underfill material 106 surrounds thesecond connector 105 c. In some embodiments, the second connector 105 cis disposed over the third conductive member 103 c-2. In someembodiments, the third conductive member 103 c-1 is electricallyisolated from the second die 105. In some embodiments, the secondconnector 105 c disposed over the third conductive member 103 c-1 isabsent. In some embodiments, the second connector 105 c is only disposedover the third conductive member 103 c-2. In some embodiments, thesecond underfill material 106 is an electrically insulated adhesive forsecuring a bonding between the second die 105 and the third conductivemember 103 c-2. In some embodiments, the second connector 105 c includesconductive material such as includes solder, copper, nickel, gold oretc. In some embodiments, the second connector 105 c is a conductivebump, a solder ball, a ball grid array (BGA) ball, controlled collapsechip connection (C4) bump, microbump, a pillar, a post or the like. Insome embodiments, the second connector 105 c is in a spherical,hemispherical or cylindrical shape.

In some embodiments, the second underfill material 106 is in contactwith an outer surface of the second connector 105 c. In someembodiments, the second underfill material 106 is disposed between thethird surface 105 a and the dielectric layer 101 a. In some embodiments,the second underfill material 106 surrounds the third surface 105 a. Insome embodiments, the second underfill material 106 is in contact with asidewall of the second die 105. In some embodiments, a portion of thesecond underfill material 106 is disposed over or is in contact with thethird conductive member 103 c-1. In some embodiments, the secondunderfill material 106 includes epoxy resin, epoxy molding compounds oretc.

FIG. 3 is a schematic cross sectional view of a semiconductor structure300 in accordance with various embodiments of the present disclosure. Insome embodiments, the semiconductor structure 300 includes a first RDL101, a first molding 102, a first conductive member 103 a, a secondconductive member 103 b, a third conductive member 103 c, a first die104, a second underfill material 106 and a first conductive bump 107,which have similar configuration as those described above or illustratedin FIG. 1 or 2.

In some embodiments, a third connector 108 is disposed over the secondconductive member 103 b. In some embodiments, the third connector 108 issurrounded by the second underfill material 106. In some embodiments, athird connector 108 is disposed over and electrically connected to thesecond conductive member 103 b. In some embodiments, the third connector108 disposed over the first conductive member 103 a is absent. In someembodiments, the third connector 108 is only disposed over the secondconductive member 103 b. In some embodiments, the third connector 108 isisolated from the first conductive member 103 a. In some embodiments,the third connector 108 includes conductive material such as includessolder, copper, nickel, gold or etc. In some embodiments, the thirdconnector 108 is a conductive bump, a solder ball, a ball grid array(BGA) ball, controlled collapse chip connection (C4) bump, microbump, apillar, a post or the like. In some embodiments, the third connector 108is in a spherical, hemispherical or cylindrical shape.

In some embodiments, a second RDL 110 is disposed over the underfill106, the molding 102 and the first RDL 101. In some embodiments, thesecond RDL 110 includes a second dielectric layer 110 a, a second landportion 110 d and a second via portion 110 e. In some embodiments, thesecond RDL 110, the second dielectric layer 110 a, the second landportion 110 d and the second via portion 110 e have similarconfiguration as the first RDL 101, the first dielectric layer 101 a,the first land portion 101 d and the first via portion 101 erespectively described above or illustrated in FIG. 1 or 2.

In some embodiments, a second molding 112 is disposed over the secondRDL 110. In some embodiments, the second molding 112 has similarconfiguration as the first molding 102 described above or illustrated inFIG. 1 or 2.

In some embodiments, a fourth conductive member 113 a and a fifthconductive member 113 b are extended through the second molding 112. Insome embodiments, a sixth conductive member (113 c-1, 113 c-2) isextended from the second molding 112 to the second dielectric layer 110a. In some embodiments, the fourth conductive member 113 a, the fifthconductive member 113 b and the sixth conductive member (113 c-1, 113c-2) have similar configuration as the first conductive member 103 a,the second conductive member 103 b and the third conductive member (103c-1, 103 c-2) respectively described above or illustrated in FIG. 1 or2. In some embodiments, the sixth conductive member 113 c-1 is coveredby the second molding 112. In some embodiments, a top surface of thesixth conductive member 113 c-1 is in contact with the second molding112.

In some embodiments, a third die 114 is disposed over the second RDL110. In some embodiments, the third die 114 is surrounded by the secondmolding 112. In some embodiments, the third die 114 is electricallyconnected to the first land portion 101 d or the first via portion 101 ethrough a fourth connector 114 d. In some embodiments, a fourthunderfill material 114 e is disposed between the third die 114 and thesecond RDL 110 to surround the fourth connector 114 d. In someembodiments, the third die 114, the fourth connector 114 d and thefourth underfill material 114 e have similar configuration as the firstdie 104, the first connector 104 d and the first underfill material 104e respectively described above or illustrated in FIG. 1 or 2.

In some embodiments, a second die 105 is disposed over the secondmolding 112, and a second connector 105 c is disposed over the fifthconductive member 113 b to electrically connect the second die 105 tothe fifth conductive member 113 b through the second connector 105 c. Insome embodiments, the second die 105 and the second connector 105 c havesimilar configuration as described above or illustrated in FIG. 1 or 2.In some embodiments, the second connector 105 c disposed over the fourthconductive member 113 a is absent. In some embodiments, the fourthconductive member 113 a is electrically isolated from the second die105. In some embodiments, the second connector 105 c is only disposedover the fifth conductive member 113 b.

In some embodiments, a third underfill material 116 is disposed betweenthe second die 105 and the second molding 112. In some embodiments, thethird underfill material 116 surrounds the second connector 105 c. Insome embodiments, the third underfill material 116 is disposed over oris in contact with the fourth conductive member 113 a. In someembodiments, the third underfill material 116 has similar configurationas the second underfill material 106 described above or illustrated inFIG. 1 or 2.

FIG. 4 is a schematic cross sectional view of a semiconductor structure400 in accordance with various embodiments of the present disclosure. Insome embodiments, the semiconductor structure 400 includes a first RDL101, a first molding 102, a first conductive member 103 a, a secondconductive member 103 b, a third conductive member 103 c, a first die104, a first conductive bump 107, a second RDL 110, a third die 114 anda sixth conductive member (113 c-1, 113 c-2), which have similarconfiguration as those described above or illustrated in any one ofFIGS. 1-3.

In some embodiments, the second RDL 110 is disposed over the secondmolding 102. In some embodiments, the third die 114 is disposed over thesecond RDL 1110. In some embodiments, the third die 114 is surrounded bythe underfill material 106. In some embodiments, a third surface 114 aand a fourth surface 114 b of the third die 114 are in contact with theunderfill material 106. In some embodiments, a second connector 105 c isdisposed over the sixth conductive member 113 c-2. In some embodiments,the second connector 105 c disposed over the sixth conductive member 113c-1 is absent. In some embodiments, the second die 105 is electricallyconnected to the second land portion 110 d through the second connector105 c. In some embodiments, the sixth conductive member 113 c-1 iselectrically isolated from the second die 105. In some embodiments, thesixth conductive member 113 c-1 is covered by the underfill material106. In some embodiments, a top surface of the sixth conductive member113 c-1 is in contact with the underfill material 106.

FIGS. 5-8 are schematic cross sectional views of a semiconductorstructure (100, 200, 300, 400) along AA′, BB′, CC′ or DD′ in FIGS. 1-4,showing various arrangements of conductive members (103 a, 103 b, 103c-1, 103 c-2, 113 a, 113 b, 113 c-1, 113 c-2). In some embodiments asshown in FIG. 5, the first conductive member 103 a, the third conductivemember 103 c-1, the fourth conductive member 113 a or the sixthconductive member 113 c-1 is arranged proximal to a periphery of thesemiconductor structure (100, 200, 300, 400). In some embodiments asshown in FIG. 6, the first conductive member 103 a, the third conductivemember 103 c-1, the fourth conductive member 113 a or the sixthconductive member 113 c-1 is arranged at or near a corner of thesemiconductor structure (100, 200, 300, 400).

In some embodiments as shown in FIG. 7, the first conductive member 103a, the third conductive member 103 c-1, the fourth conductive member 113a or the sixth conductive member 113 c-1 is arranged proximal to thefirst die 104 or the third die 114. In some embodiments, the firstconductive member 103 a, the third conductive member 103 c-1, the fourthconductive member 113 a or the sixth conductive member 113 c-1 surroundsthe first die 104 or the third die 114. In some embodiments as shown inFIG. 8, the first conductive member 103 a, the third conductive member103 c-1, the fourth conductive member 113 a or the sixth conductivemember 113 c-1 is arranged in staggered or random manner.

In the present disclosure, a method of manufacturing a semiconductorstructure (100, 300, 400) is also disclosed. In some embodiments, asemiconductor structure (100, 300, 400) is formed by a method 500. Themethod 500 includes a number of operations and the description andillustration are not deemed as a limitation as the sequence of theoperations. FIG. 9 is an embodiment of the method 500 of manufacturingthe semiconductor structure (100, 300, 400). The method 500 includes anumber of operations (501, 502, 503, 504, 505, 506).

In operation 501, a redistribution layer (RDL) 101 is formed as shown inFIG. 9A. In some embodiments, a carrier 109 is provided, and the RDL 101is formed over the carrier 109. In some embodiments, a carrier 109 isprovided for temporarily supporting components subsequently disposedthereon. In some embodiments, the carrier 109 is a substrate or a wafer.In some embodiments, the carrier 109 includes silicon, glass, ceramic orthe like.

In some embodiments, the RDL 101 is formed by disposing a dielectriclayer 101 a over the carrier 109, removing some portions of thedielectric layer 101 a to form some recesses, and disposing a conductivematerial into the recesses to form conductive trace (land portion 101 d,via portion 101 e) within the dielectric layer 101 a and a thirdconductive member 103 c partially within the dielectric layer 101 a. Insome embodiments, the third conductive member 103 c is a conductive pad.In some embodiments, the RDL 101, the dielectric layer 101 a, the landportion 101 d and the via portion 101 e have similar configuration asthose described above or illustrated in FIG. 1 or 3.

In some embodiments, the dielectric layer 101 a is disposed by spincoating, chemical vapor deposition (CVD) or any other suitableoperations. In some embodiments, the portions of the dielectric layer101 a are removed by photolithography, etching or any other suitableoperations. In some embodiments, the conductive material is disposed bysputtering, electroplating or any other suitable operations.

In operation 502, a first conductive member 103 a and a secondconductive member 103 b are formed over the RDL 101 as shown in FIG. 9B.In some embodiments, the first conductive member 103 a and the secondconductive member 103 b are formed over the third conductive member 103c. In some embodiments, the first conductive member 103 a and the secondconductive member 103 b are extended from the third conductive member103 c. In some embodiments, the first conductive member 103 a and thesecond conductive member 103 b are electrically connected to theconductive trace (101 d, 101 e) in the RDL 101. In some embodiments, thefirst conductive member 103 a and the second conductive member 103 b areconductive vias. In some embodiments, the first conductive member 103 aand the second conductive member 103 b have similar configuration asthose described above or illustrated in FIG. 1 or 3.

In some embodiments, the first conductive member 103 a and the secondconductive member 103 b are formed by disposing a photoresist over theRDL 101, removing some portions of the photoresist to form some recessesover the third conductive member 103 c, and disposing a conductivematerial over the third conductive member 103 c. In some embodiments,the first conductive member 103 a and the second conductive member 103 bare formed by sputtering, electroplating or any other suitableoperations. In some embodiments, the first conductive member 103 a andthe second conductive member 103 b are formed separately orsimultaneously.

In operation 503, a first electrical test is performed as shown in FIG.9C. In some embodiments, the first electrical test is performed throughthe first conductive member 103 a. In some embodiments, the firstconductive member 103 a is a dummy conductive member for testing. Insome embodiments, the first conductive member 103 a or the secondconductive member 103 b is exposed from the RDL 101 upon the performanceof the first electrical test. In some embodiments, the first electricaltest is configured to test an interconnection of the conductive trace(101 d, 101 e) in the RDL 101 or identify a failure of the conductivetrace (101 d, 101 e) in the RDL 101 and problematic RDL 101 such as poorelectrical interconnection, short circuit, crack, delamination, etc. Assuch, problematic RDL 101 or conductive trace (101 d, 101 e) can beidentified immediately after the formation of the first conductivemember 103 a or the second conductive member 103 b.

In some embodiments, the first electrical test is performed byelectrically connecting a probe card 201 to the conductive trace (101 d,101 e) in the RDL 101 through the first conductive member 103 a. In someembodiments, the probe card 201 is electrically connected to the firstconductive member 103 a through a probe card terminal 201 c. In someembodiments, the probe card 201 includes a power supply 201 a and isembedded with a chip 201 b or a functional circuitry such as a memory, adynamic random access memory (DRAM), a flash memory, a NAND flash memoryor a serial peripheral interface (SPI) memory.

In operation 504, a first die 104 is disposed over the RDL 101 as shownin FIG. 9D. In some embodiments, the first electrical test (theoperation 503) is performed prior to the disposing of the first die 104(the operation 504). In some embodiments, the first die 104 is disposedover the third conductive member 103 c. In some embodiments, the firstdie 104 includes a first die pad 104 c disposed over or within a surfaceof the first die 104 and a first connector 104 d disposed over the firstdie pad 104 c and bonded with the third conductive member 103 c. In someembodiments, the first die 104 is surrounded by the first conductivemember 103 a or the second conductive member 103 b. In some embodiments,the first conductive member 103 a or the second conductive member 103 bis electrically connected to the first die 104 through the conductivetrace (101 d, 101 e). In some embodiments, a first underfill material104 e is disposed between the RDL 101 and the first die 104 to surroundthe first die 104. In some embodiments, the first die 104 includes asidewall 104 f disposed between a first surface 104 a and a secondsurface 104 b. In some embodiments, the sidewall 104 f is verticallyextended between the first surface 104 a and the second surface 104 b.In some embodiments, the first die 104 is singulated from a wafer orsubstrate. In some embodiments, the first die 104 is formed by cuttingthe wafer along the sidewall 104 f. In some embodiments, the first die104 is singulated by die sawing, laser cutting or any other suitableoperations. In some embodiments, the sidewall 104 f has roughness afterthe singulation operations. In some embodiments, a roughness of thefirst surface 104 a or the second surface 104 b is substantially lessthan the roughness of the sidewall 104 f. In some embodiments, the firstdie 104, the first surface 104 a, the second surface 104 b, the firstdie pad 104 c, the first connector 104 d, the first underfill material104 e and the sidewall 104 f have similar configuration as thosedescribed above or illustrated in FIG. 1 or 3.

In operation 505, a second electrical test is performed as shown in FIG.9E. In some embodiments, the second electrical test is performed throughthe first conductive member 103 a. In some embodiments, the firstconductive member 103 a, the second conductive member 103 b is exposedfrom the RDL 101 upon the performance of the second electrical test. Insome embodiments, the first die 104 is exposed upon the performance ofthe second electrical test. In some embodiments, the first surface 104a, the second surface 104 b or the sidewall 104 f of the first die 104is exposed to the ambient environment upon the performance of the secondelectrical test. In some embodiments, the second surface 104 b and thesidewall 104 f of the first die 104 are exposed to the ambientenvironment upon the performance of the second electrical test. In someembodiments, the second electrical test is configured to test the firstdie 104 or identify problematic first die 104 such as failure of thefirst die 104, poor electrical interconnection in the first die 104,short circuit in the first die 104, etc. As such, problematic first die104 can be identified immediately after the disposing of the first die104.

In some embodiments, the second electrical test is performed byelectrically connecting the probe card 201 to the first die 104 throughthe first conductive member 103 a. In some embodiments, the probe card201 is electrically connected to the first die 104 through a probe cardterminal 201 c. In some embodiments, the probe card 201 includes thepower supply 201 a and is embedded with the chip 201 b or a functionalcircuitry such as a memory, a dynamic random access memory (DRAM), aflash memory, a NAND flash memory or a serial peripheral interface (SPI)memory.

In some embodiments, a molding 102 is formed as shown in FIG. 9F. Insome embodiments, the molding 102 is formed after the performance of thefirst electrical test (the operation 503) or the performance of thesecond electrical test (the operation 504). In some embodiments, themolding 102 is formed by transfer molding, injection molding or anyother suitable operations. In some embodiments, the molding 102 isdisposed over the RDL 101. In some embodiments, the molding 102surrounds the first die 104, the first conductive member 103 a and thesecond conductive member 103 b. In some embodiments, the thirdconductive member 103 c is partially surrounded by the molding 102. Insome embodiments, the molding 102 is in contact with the second surface104 b and the sidewall 104 f of the first die 104, an outer surface ofthe first conductive member 103 a and an outer surface of the secondconductive member 103 b. In some embodiments, the molding 102 hassimilar configuration as the one described above or illustrated in FIG.1 or 3.

In operation 506, a second die 105 is disposed over the first die 104 asshown in FIG. 9G. In some embodiments, the second die 105 is disposedover the first conductive member 103 a or the second conductive member103 b. In some embodiments, the second electrical test (the operation505) is performed prior to the disposing of the second die 105. In someembodiments, the second die 105 includes a second connector 105 cdisposed over the second conductive member 103 b. In some embodiments,the second connector 105 c is electrically connected to the secondconductive member 103 b. In some embodiments, the second die 105 iselectrically connected to the conductive trace (101 d, 101 e) throughthe second connector 105 c and the second conductive member 103 b. Insome embodiments, the second connector 105 c is only disposed over orelectrically connected to the second conductive member 103 b. In someembodiments, the first conductive member 103 a is electrically isolatedfrom the second die 105 or the second connector 105 c. In someembodiments, the first conductive member 103 a is isolated from thesecond die 105 or the second connector 105 c. In some embodiments, thesecond connector 105 c disposed over the first conductive member 103 ais absent. In some embodiments, the second die 105 has similarconfiguration as the one described above or illustrated in FIG. 1 or 3.

In some embodiments, an second underfill material 106 is disposedbetween the second die 105 and the molding 102 as shown in FIG. 9H. Insome embodiments, the second underfill material 106 is disposed over thefirst die 104, the first conductive member 103 and the second conductivemember 103 b. In some embodiments, the second die 105 is partiallysurrounded by the second underfill material 106. In some embodiments, afourth surface 105 b and a sidewall of the second die 105 are in contactwith the second underfill material 106. In some embodiments, a thirdsurface 105 a of the second die 105 is exposed from the second underfillmaterial 106. In some embodiments, a portion of the second underfillmaterial 106 is in contact with the first conductive member 103 a. Insome embodiments, the first conductive member 103 a is covered by thesecond underfill material 106. In some embodiments, the second underfillmaterial 106 is disposed by injection, flowing or any other suitableoperations. In some embodiments, the second underfill material 106 hassimilar configuration as the one described above or illustrated in FIG.1 or 3.

In some embodiments, the carrier 109 is removed as shown in FIG. 9I. Insome embodiments, the carrier 109 is removed after the disposing of thesecond die 105 or the disposing of the second underfill material 106. Insome embodiments, the carrier 109 is debonded from the RDL 101 or thedielectric layer 101 a.

In some embodiments, a conductive bump 107 is disposed over the RDL 101as shown in FIG. 9J. In some embodiments, the first electrical test (theoperation 503) and the second electrical test (the operation 505) areperformed prior to the disposing of the conductive bump 107. In someembodiments, the conductive bump 107 is disposed over a second side 101c of the RDL 101. In some embodiments, the conductive bump 107 isdisposed over the land portion 101 d. In some embodiments, theconductive bump 107 is electrically connected to the conductive trace(101 d, 101 e), the first die 104, the first conductive member 103 a,the second conductive member 103 b, the third conductive member 103 c orthe second die 105. In some embodiments, the conductive bump 107 isdisposed by ball dropping, solder pasting, stencil printing or othersuitable operations. In some embodiments, the conductive bump 107 hassimilar configuration as the one described above or illustrated in FIG.1 or 3. In some embodiments, a semiconductor structure 100 is formedwhich has similar configuration as the one in FIG. 1.

In the present disclosure, a method of manufacturing a semiconductorstructure (200, 300, 400) is also disclosed. In some embodiments, asemiconductor structure (200, 300, 400) is formed by a method 600. Themethod 600 includes a number of operations and the description andillustration are not deemed as a limitation as the sequence of theoperations. FIG. 10 is an embodiment of the method 600 of manufacturingthe semiconductor structure (200, 300, 400). The method 600 includes anumber of operations (601, 602, 603, 604, 605).

In operation 601, a RDL 101 is formed as shown in FIG. 10A. In someembodiments, a third conductive member (103 c-1, 103 c-2) is formed overa dielectric layer 101 a of the RDL 101. In some embodiments, the thirdconductive member (103 c-1, 103 c-2) is a conductive pad disposed overthe RDL 101. In some embodiments, the operation 601 is similar to theoperation 501 as shown in FIG. 9A.

In operation 602, a first electrical test is performed as shown in FIG.10B. In some embodiments, the first electrical test is performed throughthe third conductive member 103 c-1. In some embodiments, the thirdconductive member 103 c-1 is a dummy conductive member for testing. Insome embodiments, the third conductive member (103 c-1, 103 c-2) isexposed from the RDL 101 upon the performance of the first electricaltest. In some embodiments, the first electrical test is configured totest an interconnection of the conductive trace (101 d, 101 e) in theRDL 101 or identify a failure of the conductive trace (101 d, 101 e) inthe RDL 101 and problematic RDL 101 such as poor electricalinterconnection, short circuit, crack, delamination, etc. As such,problematic RDL 101 or conductive trace (101 d, 101 e) can be identifiedimmediately after the formation of the third conductive member (103 c-1,103 c-2).

In some embodiments, the first electrical test is performed byelectrically connecting a probe card 201 to the conductive trace (101 d,101 e) in the RDL 101 through the third conductive member 103 c-1. Insome embodiments, the probe card 201 is electrically connected to the fthird conductive member 103 c-1 through a probe card terminal 201 c. Insome embodiments, the probe card 201 includes a power supply 201 a andis embedded with a chip 201 b or a functional circuitry such as amemory, a dynamic random access memory (DRAM), a flash memory, a NANDflash memory or a serial peripheral interface (SPI) memory.

In operation 603, a first die 104 is disposed over the RDL 101 as shownin FIG. 10C. In some embodiments, the operation 603 is similar to theoperation 504 as shown in FIG. 9D.

In operation 604, a second electrical test is performed as shown in FIG.10D. In some embodiments, the second electrical test is performedthrough the third conductive member 103 c-1. In some embodiments, thethird conductive member (103 c-1, 103 c-2) is exposed from the RDL 101upon the performance of the second electrical test. In some embodiments,the first die 104 is exposed upon the performance of the secondelectrical test. In some embodiments, a first surface 104 a, a secondsurface 104 b or a sidewall 104 f of the first die 104 is exposed to theambient environment upon the performance of the second electrical test.In some embodiments, the second surface 104 b and the sidewall 104 f ofthe first die 104 are exposed to the ambient environment upon theperformance of the second electrical test. In some embodiments, thesecond electrical test is configured to test the first die 104 oridentify problematic first die 104 such as failure of the first die 104,poor electrical interconnection in the first die 104, short circuit inthe first die 104, etc. As such, problematic first die 104 can beidentified immediately after the disposing of the first die 104.

In some embodiments, the second electrical test is performed byelectrically connecting the probe card 201 to the first die 104 throughthe third conductive member 103 c-1. In some embodiments, the probe card201 is electrically connected to the first die 104 through a probe cardterminal 201 c. In some embodiments, the probe card 201 includes thepower supply 201 a and is embedded with the chip 201 b or a functionalcircuitry such as a memory, a dynamic random access memory (DRAM), aflash memory, a NAND flash memory or a serial peripheral interface (SPI)memory.

In operation 605, a second die 105 is disposed as shown in FIG. 10E. Insome embodiments, the second die 105 is disposed over the thirdconductive member 103 c-2. In some embodiments, the second electricaltest (the operation 604) is performed prior to the disposing of thesecond die 105. In some embodiments, the second die 105 includes asecond connector 105 c disposed over the third conductive member 103c-2. In some embodiments, the second connector 105 c is electricallyconnected to the third conductive member 103 c-2. In some embodiments,the second die 105 is electrically connected to the conductive trace(101 d, 101 e) through the second connector 105 c and the thirdconductive member 103 c-2. In some embodiments, the second connector 105c is only disposed over or electrically connected to the thirdconductive member 103 c-2. In some embodiments, the third conductivemember 103 c-1 is electrically isolated from the second die 105 or thesecond connector 105 c. In some embodiments, the third conductive member103 c-1 is isolated from the second die 105 or the second connector 105c. In some embodiments, the second connector 105 c disposed over thethird conductive member 103 c-1 is absent.

In some embodiments, an second underfill material 106 is disposedbetween the second die 105 and the molding 102 as shown in FIG. 10F. Insome embodiments, the second underfill material 106 is disposed betweenthe second die 105 and the RDL 101. In some embodiments, the secondunderfill material 106 surrounds the second connector 105 c and thefirst die 104. In some embodiments, the second die 105 is partiallysurrounded by the second underfill material 106. In some embodiments,the second underfill material 106 is in contact with a fourth surface105 b of the second die 105, a sidewall of the second die 105, the firstsurface 104 a of the first die 104, the second surface 104 b of thefirst die 104 and the sidewall 104 f of the first die 104. In someembodiments, the third conductive member 103 c is covered or surroundedby the second underfill material 106. In some embodiments, the secondunderfill material 106 has similar configuration as the one describedabove or illustrated in FIG. 2 or 4.

In some embodiments, the carrier 109 is removed as shown in FIG. 10G. Insome embodiments, the carrier 109 is removed after the disposing of thesecond die 105 or the disposing of the second underfill material 106. Insome embodiments, the carrier 109 is debonded from the RDL 101 or thedielectric layer 101 a.

In some embodiments, a conductive bump 107 is disposed over the RDL 101as shown in FIG. 10H. In some embodiments, the first electrical test(the operation 602) and the second electrical test (the operation 604)are performed prior to the disposing of the conductive bump 107. In someembodiments, the conductive bump 107 is disposed over a second side 101c of the RDL 101. In some embodiments, the conductive bump 107 isdisposed over the land portion 101 d. In some embodiments, theconductive bump 107 is electrically connected to the conductive trace(101 d, 101 e), the first die 104, the third conductive member 103 c orthe second die 105. In some embodiments, the conductive bump 107 isdisposed by ball dropping, solder pasting, stencil printing or othersuitable operations. In some embodiments, the conductive bump 107 hassimilar configuration as the one described above or illustrated in FIG.2 or 4. In some embodiments, a semiconductor structure 200 is formedwhich has similar configuration as the one in FIG. 2.

In the present disclosure, a semiconductor structure is disclosed. Thesemiconductor structure includes a dummy conductive member forelectrical testing during the manufacturing of the semiconductorstructure. A die or an electrical interconnection in the semiconductorstructure can be tested through the dummy conductive member during themanufacturing. As such, failure of die or problematic electricalinterconnection can be identified before the completion of thesemiconductor structure. Therefore, wastage of material can be minimizedand a yield of the semiconductor structure can be increased or improved.

In some embodiments, a method of manufacturing a semiconductor structureincludes forming a redistribution layer (RDL); forming a conductivemember over the RDL; performing a first electrical test through theconductive member; disposing a first die over the RDL; performing asecond electrical test through the conductive member; and disposing asecond die over the first die and the conductive member.

In some embodiments, the first electrical test is performed prior to thedisposing of the first die and the disposing of the second die, or thesecond electrical test is performed prior to the disposing of the seconddie. In some embodiments, the conductive member is exposed from the RDLupon the performance of the first electrical test or the performance ofthe second electrical test. In some embodiments, the conductive memberis electrically connected to the first die or a conductive trace in theRDL. In some embodiments, the conductive member is electrically isolatedfrom the second die. In some embodiments, the conductive member is aconductive via or a conductive pad disposed over the RDL. In someembodiments, the conductive member is surrounded by a molding. In someembodiments, the conductive member is surrounded by an underfillmaterial, or the underfill material is disposed over the conductivemember.

In some embodiments, a method of manufacturing a semiconductor structureincludes forming a redistribution layer (RDL); forming a firstconductive member over the RDL; forming a second conductive member overthe RDL; performing a first electrical test through the first conductivemember; disposing a first die over the first RDL; performing a secondelectrical test through the first conductive member; disposing a seconddie over the first conductive member, the second conductive member andthe first die; and disposing a conductive bump over the RDL, wherein thefirst conductive member is electrically isolated from the second die,and the second conductive member is electrically connected to the firstdie and a conductive trace in the RDL.

In some embodiments, the first conductive member and the secondconductive member are formed separately or simultaneously. In someembodiments, the first conductive member and the second conductivemember are surrounded by a molding. In some embodiments, a portion ofthe molding is in contact with the first conductive member. In someembodiments, the first conductive member is covered by or surrounded byan underfill material. In some embodiments, a portion of the underfillmaterial is in contact with the first conductive member. In someembodiments, a connector is disposed over the second conductive memberto electrically connect the second die to the RDL. In some embodiments,the first electrical test and the second electrical test are performedprior to the disposing of the conductive bump. In some embodiments, thefirst electrical test includes electrically connecting a probe card tothe RDL through the first conductive member, or the second electricaltest includes electrically connecting the probe card to the first diethrough the first conductive member. In some embodiments, the probe cardis embedded with a memory, a dynamic random access memory (DRAM), aflash memory, a NAND flash memory or a serial peripheral interface (SPI)memory.

In some embodiments, a semiconductor structure includes a redistributionlayer (RDL) including a dielectric layer and a conductive trace withinthe dielectric layer; a first conductive member disposed over the RDLand electrically connected with the conductive trace; a secondconductive member disposed over the RDL and electrically connected withthe conductive trace; a first die disposed over the RDL; and a seconddie disposed over the first die, the first conductive member and thesecond conductive member; wherein the first conductive member iselectrically isolated from the second die, and a connector is disposedbetween the second die and the second conductive member to electricallyconnect the second die with the conductive trace or the first die.

In some embodiments, a molding or an underfill material is disposed overthe first conductive member.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. A method of manufacturing a semiconductorstructure, comprising: forming a redistribution layer (RDL); forming aconductive member over the RDL; performing a first electrical testthrough the conductive member; bonding a first die over the RDL by aconnector; disposing a first underfill material to surround theconnector; performing a second electrical test through the conductivemember; forming a molding to surround the conductive member, the firstdie and the first underfill material; disposing a second die over thefirst die and the conductive member; and disposing a second underfillmaterial to surround the second die, wherein the conductive member is atleast partially exposed from the molding and is in contact with thesecond underfill material, the conductive member is protruded from theRDL during the first electrical test and the second electrical test. 2.The method of claim 1, wherein the first electrical test is performedprior to the disposing of the first die and the disposing of the seconddie, or the second electrical test is performed prior to the disposingof the second die.
 3. The method of claim 1, wherein the conductivemember is exposed from the RDL upon the performance of the firstelectrical test or the performance of the second electrical test.
 4. Themethod of claim 1, wherein the conductive member is electricallyconnected to the first die or a conductive trace in the RDL.
 5. Themethod of claim 1, wherein the conductive member is electricallyisolated from the second die.
 6. The method of claim 1, wherein theconductive member is a conductive via or a conductive pad disposed overthe RDL.
 7. The method of claim 1, wherein the first electrical test andthe second electrical test are performed through a surface of theconductive member, and the surface is exposed from the molding and incontact with the second underfill material.
 8. The method of claim 1,wherein the first die is exposed during the second electrical test.
 9. Amethod of manufacturing a semiconductor structure, comprising: forming aredistribution layer (RDL); forming a first conductive member over theRDL; forming a second conductive member over the RDL; performing a firstelectrical test through the first conductive member; bonding a first dieover the first RDL by a first connector; disposing a first underfillmaterial to surround the first connector; performing a second electricaltest through the first conductive member; forming a molding to surroundthe first conductive member, the second conductive member, the first dieand the first underfill material; disposing a second die over the firstconductive member, the second conductive member and the first die;disposing a second underfill material to surround the second die; anddisposing a conductive bump over the RDL, wherein the first conductivemember is electrically isolated from the second die and is at leastpartially exposed from the molding, and the second conductive member iselectrically connected to the first die and a conductive trace in theRDL, and the second underfill material is in contact with the firstconductive member, the first conductive member and the second conductivemember are protruded from the RDL during the first electrical test andthe second electrical test.
 10. The method of claim 9, wherein the firstconductive member and the second conductive member are formed separatelyor simultaneously.
 11. The method of claim 9, wherein the first die isexposed during the second electrical test.
 12. The method of claim 9,wherein a portion of the molding is in contact with the first conductivemember.
 13. The method of claim 9, wherein the second underfill materialis disposed between the second die and the first conductive member. 14.The method of claim 9, wherein the molding is in contact with the secondunderfill material.
 15. The method of claim 9, wherein a secondconnector is disposed over the second conductive member to electricallyconnect the second die to the RDL.
 16. The method of claim 9, whereinthe first electrical test and the second electrical test are performedprior to the disposing of the conductive bump.
 17. The method of claim9, wherein the first electrical test includes electrically connecting aprobe card to the RDL through the first conductive member, or the secondelectrical test includes electrically connecting the probe card to thefirst die through the first conductive member.
 18. The method of claim17, wherein the probe card is embedded with a memory, a dynamic randomaccess memory (DRAM), a flash memory, a NAND flash memory or a serialperipheral interface (SPI) memory.
 19. A method of manufacturing asemiconductor structure, comprising: forming a redistribution layer(RDL); forming a conductive member over the RDL; performing a firstelectrical test through the conductive member; bonding a first die overthe RDL by a connector after the performing of the first electricaltest; disposing a first underfill material to surround the connector;performing a second electrical test through the conductive member;disposing a second die over the first die and the conductive memberafter the performing of the second electrical test; and disposing asecond underfill material to surround the second die, wherein theconductive member is at least partially exposed after the disposing ofthe second die and before the disposing of the second underfillmaterial, and the conductive member is protruded from the RDL during thefirst electrical test.
 20. The method of claim 19, wherein the firstelectrical test is performed to test an interconnection of a conductivetrace in the RDL, and the second electrical test is performed to testthe first die.